Title: A software reliability growth model considering testing coverage subject to field environment
Authors: Sulekha Rani; Priyanka Agarwal; Madhu Jain; Rahul Solanki
Addresses: Department of Mathematics, Indraprastha College for Women, 31 Sham Nath Marg, Civil Lines, New Delhi, 110054, India ' Department of Applied Sciences, SRM Institute of Science and Technology, Delhi NCR Campus, Modinagar, UP 201204, India ' Department of Mathematics, Indian Institute of Technology Roorkee, Roorkee 247667, India ' Department of Applied Sciences, SRM Institute of Science and Technology, Delhi-NCR Campus, Modinagar, UP 201204, India
Abstract: Software reliability growth models are the basic models which predict essential information such as software cost and reliability required for the software development activities. It was assumed that the software behave in the field in the same way as they perform during testing but this assumption may not be true in every situation. In this paper, we discuss such a software reliability growth model which will predict the reliability according to the field environment incorporating two types of S-shaped testing coverage factors. Total expected cost (with warranty and risk cost) and optimal release time for the proposed reliability growth model is proposed. Numerical results using software 'MATLAB' help the software engineers for making their best decision.
Keywords: NHPP based SRGM; testing coverage; expected cost; risk cost.
DOI: 10.1504/IJMOR.2021.112944
International Journal of Mathematics in Operational Research, 2021 Vol.18 No.2, pp.145 - 153
Accepted: 25 Jul 2019
Published online: 10 Feb 2021 *