Title: Designing of single acceptance sampling plan based on time truncated life test under new Weibull-Pareto distribution

Authors: S. Swathi Sundari; G. Kannan; S. Balamurali; K. Lakshmanan; G. Selvaraj

Addresses: Department of Mathematics, V.V. Vanniaperumal College for Women (Autonomous), Virudhunagar 626001, Tamil Nadu, India ' Department of Mathematics, Ramco Institute of Technology, Rajapalayam 626117, Tamil Nadu, India ' Department of Mathematics, Kalasalingam Academy of Research and Education, Krishnankoil 626126, Tamil Nadu, India ' Department of Mathematics, St. Joesph University, Chümoukedima 797115, Nagaland, India ' Department of Mathematics, Ramco Institute of Technology, Rajapalayam 626117, Tamil Nadu, India

Abstract: This article focuses on designing a single acceptance sampling plan (SASP) that guarantees the percentile lifetime (lifespan) of a product follows a new Weibull-Pareto distribution (NWPD) on the basis of a time-truncated life test (TTL) with a known shape parameter. Considering both producer's risk (α) and consumer's risk (β), a two-point technique to the operating characteristic (OC) curve is applied in this study to find the most appropriate suitable plan parameters like sample size (n) and acceptance number (c). Our aim is to simultaneously satisfy the expectations of both producers and consumers. To select the most appropriate plan parameters, we generate tables representing various percentile values of the NWPD.

Keywords: new Weibull-Pareto distribution; NWPD; percentile life; single acceptance sampling plan; SASP; time truncated life test; TTL test.

DOI: 10.1504/IJMOR.2026.152960

International Journal of Mathematics in Operational Research, 2026 Vol.33 No.4, pp.489 - 500

Received: 17 Apr 2024
Accepted: 08 May 2024
Published online: 17 Apr 2026 *

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