Inderscience PublishersInderscience PublishersInderscience Publishers
  PUBLISHERS OF DISTINGUISHED ACADEMIC, SCIENTIFIC AND PROFESSIONAL JOURNALS

Article Abstract

Title: Quality of Experience-LAOS: create once, use many, use anywhere
  Author: Cristina Hava Muntean, Gabriel-Miro Muntean, Jennifer McManis, Alexandra I. Cristea   Email author(s)
  Address: School of Informatics, National College of Ireland, Dublin 1, Ireland. ' Performance Engineering Laboratory, School of Electronic Engineering, Dublin City University, Glasnevin, Dublin 9, Ireland. ' Performance Engineering Laboratory, School of Electronic Engineering, Dublin City University, Glasnevin, Dublin 9, Ireland. ' Department of Computer Science, University of Warwick, Coventry CV4 7AL, UK
  Journal: International Journal of Learning Technology 2007 - Vol. 3, No.3  pp. 209 - 229
  Abstract: This paper proposes QoE-LAOS, a Quality of Experience-oriented adaptive authoring model that enables performance-aware adaptation. It extends the existing LAOS authoring model in order to consider display and delivery performance issues. QoE-LAOS involves the addition of three new QoE sublayers: QoE Content Features sublayer, QoE Characteristics sublayer and QoE Rules sublayer. These proposed QoE sublayers are deployed at LAOS's Domain, Adaptation and Presentation Models, respectively. This paper formalises and exemplifies QoE-LAOS and discusses authoring-related issues in relation to each new sublayer.
  Keywords: adaptive hypermedia; adaptive educational hypermedia; AEH; adaptive author assistance; semi-automatic adding; authoring models; authoring tools; adaptive web application engineering; adaptive web application authoring; adaptive learning; adaptive systems; tailored information; attention to diversity; IMS learning design; user quality of experience; workplace learning; semantic desktop; metadata; RDF; CAF; learning technology.
  DOI: 10.1504/IJLT.2007.015442
  Access for editors and complimentary subscribers       Access for Subscribers   Purchase this Paper        We welcome your comments about this paper Comment on the Paper