A simulation study of an operational amplifier with non-ideal carbon nanotube transistor: case of scattering effect
by W. Makni; M. Najari; H. Samet
International Journal of Nanotechnology (IJNT), Vol. 12, No. 8/9, 2015

Abstract: This paper presents an extension of the ballistic carbon nanotube field-effect transistor (CNTFET) Raychowdhury [1] compact model with adding acoustic phonon (AP) and optical phonon scattering (OP) mechanisms. These mechanisms cause noise in the device. To obtain an accurate compact model, the flicker and thermal noise-models should be included. This model can be easily implemented with a hardware description language (HDL)-like Verilog-A in the Agilent Advanced Design System simulation tool ADS. The impact of the AP scattering mechanism on operational amplifier (Op Amp) circuit performances is investigated and the simulation results are compared with respect to Op Amp including both AP and OP scattering and to Amp Op using ballistic model. Hence, degradation in the Op Amp performances with AP and OP scattering models is observed especially in gain and bandwidth figure of merits in addition to the increase of the flicker noise in the device.

Online publication date: Fri, 17-Apr-2015

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Nanotechnology (IJNT):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com