The Canadian Centre for Electron Microscopy: a national facility for ultrahigh resolution electron microscopy
by Gianluigi A. Botton
International Journal of Nanotechnology (IJNT), Vol. 5, No. 9/10/11/12, 2008

Abstract: The Canadian Centre for Electron Microscopy is described and the facilities available to Canadian researchers and international collaborators are presented. The facility offers aberration-corrected transmission electron microscopy instrumentation, conventional transmission electron microscopes, scanning electron microscopes and a suite of sample preparation facilities. The advantages and benefits of aberration corrected microscopy are described and applications of this technique in materials science are discussed. Examples of applications of the current instrumentation and the improvements in spectroscopic capabilities are presented. For the benefit of users of the facility, the technical configurations of the instruments, the environment, the mode of operation of the Centre as well as the governing structure are presented.

Online publication date: Sat, 09-Aug-2008

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