An effective joint X-bar and R chart to monitor the process mean and variance
by D.R. Prajapati, P.B. Mahapatra
International Journal of Productivity and Quality Management (IJPQM), Vol. 2, No. 4, 2007

Abstract: When the shift occurs in both sample mean and standard deviation of a process, a joint X-bar and R charts can be used to monitor the process mean and variance. This paper deals with very simple and effective design of proposed X-bar and R charts to monitor the process mean and standard deviation. The concept of the proposed chart is based upon the sum of chi-square (χ²) to compute and compare Average Run Length values (ARLs). Although Variable Sample Size (VSS), Variable Sampling Interval (VSI) and Variable Sample Size and Sampling Interval (VSSI) joint charts are very useful to catch the small shifts in the mean or standard deviation, they make the chart more complex and very difficult to use at shop-floor level. The performance of the proposed chart has been compared with VSS, VSI and VSSI joint schemes proposed by Costa (1999).

Online publication date: Sat, 21-Apr-2007

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Productivity and Quality Management (IJPQM):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email