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Seeing inside materials by aberration-corrected electron microscopy
S.J. Pennycook; K. Van Benthem; A.G. Marinopoulos; S-H. Oh; S.I. Molina; A.Y. Borisevich; W. Luo; S.T. Pantelides
International Journal of Nanotechnology (IJNT), 2011 Vol.8 No.10/11/12, pp.935 - 947
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