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Simulation, modelling and characterisation of quasi-ballistic transport in nanometer sized field effect transistors: from TCAD to atomistic simulation
Stephan Roche, Thierry Poiroux, Gilles Lecarval, Sylvain Barraud, Francois Triozon, Martin Persson, Yann Michel Niquet
International Journal of Nanotechnology (IJNT), 2010 Vol.7 No.4/5/6/7/8, pp.348 - 366
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