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3N4-based RRAM with metal-insulator-silicon structure">

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Investigation of bipolar resistive switching characteristics in Si3N4-based RRAM with metal-insulator-silicon structure
Sungjun Kim; Sunghun Jung; Byung-Gook Park
International Journal of Nanotechnology (IJNT), 2014 Vol.11 No.1/2/3/4, pp.126 - 134
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