International Journal of Nanoparticles (IJNP)

International Journal of Nanoparticles

2013 Vol.6 No.2/3

Special Issue on Semiconductors: Microstructure and Properties

Guest Editors: Professor Nouar Tabet and Professor Djamel E. Mekki

Editorial

Pages Title and author(s)
73-80Scanning laser induced current measurements on silicon wafer with through silicon via structure
Shin-ichi Takasu; Ryouta Zaizen; Woon Choi; Hajime Tomokage; Haruki Sueyoshi
DOI: 10.1504/IJNP.2013.054982
81-92Illuminated versus dark lock-in thermography investigations of solar cells
Otwin Breitenstein
DOI: 10.1504/IJNP.2013.054983
93-102Properties of Al-doped ZnO thin films grown by pulsed laser deposition on Si(100) substrates
Fouad Kermiche; Adel Taabouche; Faouzi Hanini; Sarah Menakh; Abderrahmane Bouabellou; Yacine Bouachiba; Tahar Kerdja; Chawki Benazzouz; Mohamed Bouafia; Saad Amara
DOI: 10.1504/IJNP.2013.054984
103-112Interaction between a laser beam and semiconductor nanowires: application to the Raman spectrum of Si nanowires
J. Anaya; A. Torres; A.C. Prieto; J. Jimenez; A. Rodríguez; T. Rodríguez
DOI: 10.1504/IJNP.2013.054985
113-121Annealing effect on photoluminescence properties of SiO2/SiNx coating
S. Meziani; A. Moussi; L. Mahiou; R. Outemzabet
DOI: 10.1504/IJNP.2013.054986
122-131Characterisation of TCO AZO/glass structures by spectroscopic ellipsometry
Saâd Amara; Mohamed Bouafia
DOI: 10.1504/IJNP.2013.054987
132-142Characteristics of Al-doped TiO2 thin films grown by pulsed laser deposition
Faouzi Hanini; Yacine Bouachiba; Fouad Kermiche; Adel Taabouche; Abderrahmane Bouabellou; Tahar Kerdja; Kamel Boukheddaden
DOI: 10.1504/IJNP.2013.054988
143-152Evaluation of diameter effects of individual coaxial SiC/SiO2 nanowires on their acoustic parameters
Linda Achou; Abdellaziz Doghmane; Yahya Al-Sayad; Kahina Ammiali; Zahia Hadjoub
DOI: 10.1504/IJNP.2013.054989
153-160Ultraviolet MSM photodetector with fast response based on ZnO thin film
Ghania Harzallah; Mohamed Remram
DOI: 10.1504/IJNP.2013.054990
161-168Effect of annealing on the structural and optical properties of sputtered HfNx thin films
H. Gueddaoui; G. Schmerber
DOI: 10.1504/IJNP.2013.054991
169-177TiO2 thin films studied by FTIR, AFM and spectroscopic ellipsometry
Y. Bouachiba; F. Hanini; A. Bouabellou; F. Kermiche; A. Taabouche; M. Bouafia; S. Amara; S. Sahli; K. Boukheddaden
DOI: 10.1504/IJNP.2013.054992
178-190Characterisation of ZnO thin films doped and co-doped grown by pneumatic spray pyrolysis
F. Chouikh; Y. Beggah; H. Mati; Y. Bouznit; M. Birem; N. Ariche; M.S. Aida
DOI: 10.1504/IJNP.2013.054993
191-200Low energy electron irradiation effect on optical and electrical properties of InGaN/GaN multiple quantum well structures
E.B. Yakimov
DOI: 10.1504/IJNP.2013.054994
201-207Electroluminescence properties of InGaN/GaN multiple quantum well light emitting diodes
Yassine Sayad; Abdel Kader Nouiri
DOI: 10.1504/IJNP.2013.054995
208-214An EBIC model to describe two close grain boundaries in semiconductors
Abderrezak Lahreche; Yamina Beggah; Djamel Eddine Mekki
DOI: 10.1504/IJNP.2013.054996
215-223Calculation of an n+pSi diode collection efficiency and comparison with experiments
A. Chemam; S. Hamici; D.E. Mekki; R.J. Tarento
DOI: 10.1504/IJNP.2013.054997
224-231Physical modelling of carbon nanotube field effect transistor
Rebiha Marki; Chérifa Azizi
DOI: 10.1504/IJNP.2013.054998
232-238Effect of the surface recombination and the depletion region on the electron beam induced current at a Schottky nanocontact
Noura Ounissi; Mohammed Ledra; Nouar Tabet
DOI: 10.1504/IJNP.2013.054999
239-251Investigation of ZnO nanostructures: effect of metal and spinning speed on the physical properties
M. Benhaliliba; C.E. Benouis; M.S. Aida; Y.S. Ocak; F. Yakuphanoglu
DOI: 10.1504/IJNP.2013.055000
252-263Microstructure and opto-electrical properties of SnO2:In2O3 alloys thin films prepared by ultrasonic spray
Fayssal Ynineb; Abdelkader Hafdallah; Nadhir Attaf; Mohammed Salah Aida; Jamal Bougdira; Hervé Rinnert
DOI: 10.1504/IJNP.2013.055001
264-273Impact of the polysilicon doping level and thermal oxidation on the properties of P-MOS capacitor structures
Moufida Bouzerdoum; Boubekeur Birouk
DOI: 10.1504/IJNP.2013.055002

 

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