
International Journal of Materials and Structural Integrity
2014 Vol.8 No.1/2/3
Special Issue on Recent Studies on the Reliability of Microelectronic Materials and Devices
Guest Editors: Professor Sung Yi and Dr. Jeong Han Kim
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Special Issue on Recent Studies on the Reliability of Microelectronic Materials and Devices
Guest Editors: Professor Sung Yi and Dr. Jeong Han Kim
![]() |