Title: Risk and gain sharing challenges in interorganisational implementation of RFID technology
Authors: Daniel Hellstrom, Carina Johnsson, Andreas Norrman
Addresses: Department of Design Sciences, Division of Packaging Logistics, Lund University, P.O. Box 118, SE-221 00, Lund, Sweden. ' Department of Industrial Management and Logistics, Division of Engineering Logistics, Lund University, P.O. Box 118, SE-221 00 Lund, Sweden. ' Department of Industrial Management and Logistics, Division of Engineering Logistics, Lund University, P.O. Box 118, SE-221 00 Lund, Sweden
Abstract: Implementing collaborative change initiatives in supply chains presents various challenges. This paper proposes a framework for identifying potential risk and gain sharing challenges in collaborative change initiatives, and uses the framework to explore risk and gain sharing in an interorganisational implementation of radio frequency identification (RFID) technology. The proposed framework is based on a review of prior research while the empirical investigation is based on case study research and involves three companies jointly implementing an RFID system. The empirical study shows that intra- and interorganisational risk and gain sharing is critical to implementing RFID technology across organisations, and illustrates various risks and gains for the supply chain organisations and how these are shared. To apply the framework in practice, a model is presented that provides managers with guidelines for identifying risk and gain sharing challenges in collaborative initiatives.
Keywords: alignment; automatic identification; autoID; automotbile industry; case study; collaboration; gain sharing; information technology; information sharing; interorganisation; logistics; radio frequency identification; RFID implementation; risk sharing; supply chain management; SCM; procurement; collaborative change; automotive supply chains.
International Journal of Procurement Management, 2011 Vol.4 No.5, pp.513 - 534
Published online: 31 Jan 2015 *Full-text access for editors Access for subscribers Purchase this article Comment on this article