Title: Better defect detection and prevention through improved inspection and testing approach in small and medium scale software industry

Authors: V. Suma, T.R. Gopalakrishnan Nair

Addresses: Information Science Department and Research and Industry Incubation Center, Dayananda Sagar Institutions, Kumaraswamy Layout, Bangalore-560078, India. ' Research and Industry Incubation Center (RIIC) and Computer Science Department, Dayananda Sagar Institutions, Kumaraswamy Layout, Bangalore-560078, India

Abstract: One of the challenging issues in software industry is to deliver high quality software through effective defect management. Inspection and testing are two important approaches that address defects. An empirical study of existing inspection technique in leading small and medium scale software industries in India shows the capability in delivering maximum of 96% defect-free product. The paper aims to improve effectiveness of inspection and testing approaches for achieving 99% defect-free product. It analyses defect patterns and gives concrete ranges for inspection and testing. It introduces |depth of inspection (DI)| metric to indicate productivity and quality levels for software process. This approach emphasises that an optimal level of 10%-15% of inspection time and 15%-25% of testing time out of whole effort with DI value in the range of 0.4 to 0.7 at each phase of software development eliminates 99% defects in small and medium scale industries.

Keywords: defect detection; defect prevention; software process; software quality metrics; software inspection; software testing; productivity amanagement; quality management; small and medium-sized enterprises; software SMEs; software development.

DOI: 10.1504/IJPQM.2010.033885

International Journal of Productivity and Quality Management, 2010 Vol.6 No.1, pp.71 - 90

Published online: 03 Jul 2010 *

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