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International Journal of Risk Assessment and Management (IJRAM)

International Journal of Risk Assessment and Management

2001 Vol.2 No.1/2


Pages Title and author(s)
36-56Chapter 2 - the nature of technological failure
Mark Manion, William M. Evan
DOI: 10.1504/IJRAM.2001.001499
57-70Chapter 3: causes of technological failure
Mark Manion, William M. Evan
DOI: 10.1504/IJRAM.2001.001500
6-35Chapter 1 - natural and human-made disasters
Mark Manion, William M. Evan
DOI: 10.1504/IJRAM.2001.001498
71-80Chapter 4: three industrial revolutions
Mark Manion, William M. Evan
DOI: 10.1504/IJRAM.2001.001501
81-84Chapter 5 - analysing technological failures: the 3 x 4 matrix
Mark Manion, William M. Evan
DOI: 10.1504/IJRAM.2001.001502
85-178Chapter 6 - twelve case studies of technological failure
Mark Manion, William M. Evan
DOI: 10.1504/IJRAM.2001.001503
179-182Chapter 7 - lessons learned from the case studies of technological failure
Mark Manion, William M. Evan
DOI: 10.1504/IJRAM.2001.001504
183-210Chapter 8 - preventive strategies for technological failure
Mark Manion, William M. Evan
DOI: 10.1504/IJRAM.2001.001505

 

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