Analyses of parasitic capacitance effects and flicker noise of the DAC capacitor array for high resolution SAR ADCs
by Xicai Yue; Janice Kiely; Chris McLeod
International Journal of Computer Applications in Technology (IJCAT), Vol. 58, No. 4, 2018

Abstract: This paper analyses the effects of parasitic capacitances of unit capacitors on the accuracy and the noise performance of the DAC capacitor array in a SAR ADC, showing that thermal noise of the array decreases while gain error is introduced. The gain error is almost independent of the number of bits, but the dynamic range of the high resolution ADC is severely reduced due to the gain error. The post-layout parasitic capacitance analysis of a 10-bit poly-poly array shows a large difference between the top-plate and bottom-plate parasitic capacitances so that the gain error can be decreased by 152 times when top-plates are connected together as the output node of the array. The switching transistors' flicker noise calculation for a 10-bit and an 18-bit SAR ADC shows that flicker noise can be safely ignored for 10-bit 1MSPS SAR, but should be considered for the higher resolution SAR ADCs.

Online publication date: Mon, 05-Nov-2018

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Computer Applications in Technology (IJCAT):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com