Phase contrast X-ray imaging
by Byung Mook Weon, Jung Ho Je, Yeukuang Hwu, Giorgio Margaritondo
International Journal of Nanotechnology (IJNT), Vol. 3, No. 2/3, 2006

Abstract: In the last decade X-ray imaging based on phase contrast greatly advanced thanks to the use of unmonochromatic synchrotron hard X-rays. The recent advances are going beyond microradiology and microtomography to reach nanometre scale. This paper reviews basic theory and selected applications to biomedical and materials sciences. The forthcoming improvements in phase contrast X-ray imaging will lead to even better imaging of many different phenomena at nanometre level.

Online publication date: Mon, 01-May-2006

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