Double acceptance sampling plan based on the Burr type X distribution under truncated life tests
by Wenhao Gui; Xinman Lu
International Journal of Industrial and Systems Engineering (IJISE), Vol. 28, No. 3, 2018

Abstract: In this paper, we propose a double acceptance sampling plan for the Burr type X distribution when the lifetime experiment is truncated at a predetermined time. Considering the zero and one failure scheme, the minimum sample sizes of the first and second samples necessary to ensure the specified median life are obtained at the given consumer's confidence level. The operating characteristic values are analysed with various ratios of the true median lifetime to the specified life of the product. The minimum ratios of the median life to the specified life are also presented. We illustrate the double acceptance sampling plan with a numerical example.

Online publication date: Fri, 09-Feb-2018

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