A discussion and prediction on thermal transfer of interface structure in micro/nano manufacturing Online publication date: Fri, 13-Oct-2017
by Bing Yang; Yuanbin Xiao; Xu Zhou; Wei Gao; Ping Yang
International Journal of Materials and Structural Integrity (IJMSI), Vol. 11, No. 1/2/3, 2017
Abstract: Interface structure is a critical part of electronic components in computers, smart phones, automotive components and other electronic devices. Along with the development of technologies, the demand for electronic devices and their quality has increased rapidly in recent years. Thus, it is indispensable to study the thermal transfer of interface structure. In this article, we give a review of recent investigations on the thermal transfer of interface structure in micro/nano manufacturing. The research method is an important part of scientific research. Therefore, many research methods are listed in this paper. Some academic developments on design and reliability of interface structure by considering thermal characteristics under different loading conditions are also discussed.
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