A zero suppressed binary decision diagram-based test set relaxation for single and multiple stuck-at faults
by Navya Mohan; J.P. Anita
International Journal of Mathematical Modelling and Numerical Optimisation (IJMMNO), Vol. 7, No. 1, 2016

Abstract: This paper presents a new zero suppressed binary decision diagram (ZBDD)-based approach for obtaining larger number of relaxed bits. These test sets find major application in reducing the power consumed during testing. Experiments performed on single and multiple stuck-at faults using ZBDDs show better results in terms of percentage of relaxation over the existing comparable BDD-based approaches. Moreover using these relaxed test vectors and by suitable X-filling methods average switching activity (ASA) of the circuit can be reduced, which will reduce the power dissipation during testing.

Online publication date: Mon, 25-Jan-2016

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