Patent overlay maps: Spain and the Basque Country Online publication date: Wed, 11-Nov-2015
by Javier Gavilanes-Trapote; Rosa María Río-Belver; Ernesto Cilleruelo; Gaizka Garechana; Jaso Larruscain
International Journal of Technology Management (IJTM), Vol. 69, No. 3/4, 2015
Abstract: This study uses the new global patent map developed by Kay et al. (2014) to reflect the patenting activity of Spain together with the activity of the Basque Country, a highly industrialised region in Spain, for the time interval 2000-2006. The global patent map reflects the technology categories where a patent could be categorised according to the international patent classification (IPC) system, in addition to the degree of similarity among different IPCs, determined by using the citing-to-cited relationships as bonds between categories. An overlay method has been developed to compare, on the one hand, the patenting activity in Spain and the Basque Country and a display of the most important technology sectors and; on the other, the selection of a technology sector and an analysis of technology transfer in both regions through different IPCs to compare them and determine the possible technological sources remaining for development.
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