Developing robust design: determining critical limits for signal-to-noise ratio based on process capability index
by Arash Shahin; Arash Geramian
International Journal of Productivity and Quality Management (IJPQM), Vol. 14, No. 2, 2014

Abstract: In design of experiments (DOE), the higher the ratio of signal-to-noise (S/N) is, the better the experiment would be. However, there might be cases in which, process capability is not desirable, while the S/N ratio is high. To resolve such problem, in this study an approach has been proposed to control the ratio. For this purpose, the process capability indices, i.e., C_p and C_PK ratios have been integrated with S/N ratio, and critical ratios have been determined for the two mentioned indices. The determined ratios not only have been used in measuring the value of S/N ratio, but also have been compared with the critical ratio. In this comparison, the changes of denominator has been studied and it has been found that selecting the experiment with highest S/N ratio is done in respect of controlling its undesirable changes within acceptable limits.

Online publication date: Sat, 06-Sep-2014

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