Simulation of mechanical loading of electronic devices
by Elisabeth Keim
International Journal of Computer Applications in Technology (IJCAT), Vol. 5, No. 2/3/4, 1992

Abstract: Electronic devices for computers must be tested carefully to guarantee reliable operation. Besides experimental work, numerical methods - in this case the finite-element method (FEM) - offer great advantages because no restrictions concerning size and handling of test machines need be taken into account. For this purpose finite-element calculations are performed to bring out an optimum test configuration for a reliable test of the weakest link of the electronic device. The test piece consists of several materials with various properties, where also material nonlinearities must be considered.

Online publication date: Tue, 10-Jun-2014

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Computer Applications in Technology (IJCAT):
Login with your Inderscience username and password:

Username:        Password:          Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com