Adaptive sampling strategies for measurement of freeform surfaces using coordinate measuring machines in continuous scanning mode Online publication date: Thu, 30-Apr-2015
by G. Rajamohan; M.S. Shunmugam
International Journal of Precision Technology (IJPTECH), Vol. 4, No. 1/2, 2014
Abstract: Freeform surfaces are complex surfaces without rotational symmetry. Their measurement and verification using the coordinate measuring machines (CMMs) require a suitable sampling strategy. Considering continuous scanning CMMs, the sampling strategy involves the estimation of number of isoparametric scan lines (sample size) and identification of their positions. It is often difficult to establish such information owing to the complex nature of freeform surfaces. Adaptive strategies, satisfying certain user-defined criteria, may be used for this purpose. This research attempts to develop an adaptive sampling strategy based on dominant isoparametric lines. This strategy iteratively identifies the number of isoparametric scan lines and their positions. The iterations are controlled by positional deviations and maximum number of scan lines, both are user-defined. On the basis of comparison with an existing sampling strategy, the proposed strategy has been found to yield better results with fewer isoparametric scan lines.
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Precision Technology (IJPTECH):
Login with your Inderscience username and password:
Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.
If you still need assistance, please email subs@inderscience.com
Our Blog 
Follow us on Twitter 
Visit us on Facebook