Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-ray scattering
by Daniele Pelliccia; Andrei Y. Nikulin; Nigel Kirby; James Hester
International Journal of Nanotechnology (IJNT), Vol. 11, No. 5/6/7/8, 2014

Abstract: We report on the characterisation of embedded Al2Cu nanoparticles in Al matrix by X-ray diffraction imaging and small-angle X-ray scattering. We employed direct retrieval of the average morphological characteristics of the nanoparticles from their diffraction pattern. Data suggest the possibility of acquiring truly 3D information with X-ray diffraction imaging. Validation of the results obtained with small-angle X-ray scattering is reported.

Online publication date: Mon, 15-Dec-2014

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