Response time testing of temperature sensors using loop current step response method Online publication date: Sat, 20-Sep-2014
by H.M. Hashemian
International Journal of Nuclear Energy Science and Technology (IJNEST), Vol. 7, No. 3, 2013
Abstract: The Loop Current Step Response (LCSR) method is used for in-situ response time testing of temperature sensors as installed in an industrial process. This paper presents the theoretical foundation of the LCSR (test theory, LCSR equation and test procedures) and the author's research to validate its use in nuclear power industry applications. The validity of the LCSR method depends on how well the temperature sensor design satisfies LCSR test assumptions, the quality of LCSR data in terms of signal-to-noise ratio, the application of proper sampling parameters for the LCSR data acquisition phase, and the suitability of the algorithms and fitting processes used in the LCSR data analysis stage. In multiple tests the author demonstrated a ±10% agreement between the median values of the response time produced by the plunge and LCSR methods. The plunge test is the standard method for laboratory measurement of the response time of temperature sensors.
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Nuclear Energy Science and Technology (IJNEST):
Login with your Inderscience username and password:
Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.
If you still need assistance, please email subs@inderscience.com
Our Blog 
Follow us on Twitter 
Visit us on Facebook