System-level BIT false alarm reducing technology based on sensor network time stress analysis and the fault propagation correlation model Online publication date: Sun, 20-Jan-2013
by Kehong Lv; Zhiao Zhao; Jing Qiu; Guanjun Liu; Peng Yang
International Journal of Sensor Networks (IJSNET), Vol. 12, No. 4, 2012
Abstract: Equipment fault propagation and sensor faults are the main causes of false alarms in built-in test (BIT) systems. Hence, the current paper analyses the mechanism of system-level BIT false alarms. The technical process of system-level BIT false alarm recognition is presented. First, sensor damage states are estimated using sensor network time stress data generated during its lifetime. In different damage states, a dual support vector machine (SVM) relevance model is built, it can recognise system-level BIT type II false alarms induced by sensor faults. Subsequently, a fault propagation correlation model of the sensor network is set up. Based on this model, a false alarm recognition method is proposed based on probability reasoning. This method can effectively reduce system-level BIT type I false alarms caused by sensor network fault propagation. Lastly, a case about the helicopter horizon system is studied to validate the proposed technology.
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