Effect of temperature and voltage on LED luminaries reliability
by D.J. Liu; D.G. Yang; Miao Cai; B.Y. Wu; Xiuwen Yang; Jian Liu; Ping Yang
International Journal of Materials and Structural Integrity (IJMSI), Vol. 6, No. 2/3/4, 2012

Abstract: In this paper, the reliability of LED luminaries system after thermal-ageing test was investigated with experimental test and numerical method. Samples were aged at 45°C, 85°C and 95°C using step-stress accelerated test. The thermal resistance was measured and the failure modes were verified. After 1,692 hours, four categories of failure modes were found and main failure mechanism was analysed. The total thermal resistance of sample C and D increased by 3.24 K/W and 5.09 K/W. The thermal stress is about 687 MPa, 1,106 MPa and 1,116 MPa at different ageing temperature.

Online publication date: Thu, 18-Sep-2014

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