Near field optical microscopy: a brief review
by A.L. Lereu; A. Passian; Ph. Dumas
International Journal of Nanotechnology (IJNT), Vol. 9, No. 3/4/5/6/7, 2012

Abstract: Near Field Optical Microscopy (NSOM) has evolved into a mature member of the family of scanning probe microscopy. In this article, we briefly go over the principle of NSOM, its breakthroughs and setbacks. We will describe some of the most commonly used NSOM modalities and conclude with the recent advances based on optical nanoantennas. We will then highlight the potential of this high-resolution optical microscopy for chemical and biological applications as well as for materials sciences.

Online publication date: Mon, 06-Feb-2012

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Nanotechnology (IJNT):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com