The performance and behaviour of dual edge triggered flip-flops in nanotechnology Online publication date: Sat, 16-Aug-2014
by Abdoul Rjoub; Muna M. Al-Durrah
International Journal of Computer Aided Engineering and Technology (IJCAET), Vol. 4, No. 1, 2012
Abstract: The influence of the nanotechnology on the most frequent used dual edge trigger flip-flops (DET-FF) is presented in this paper. The performance and behavioural of those flip-flops are discussed and analysed analytically. Simulation results show that each time scaling down the SPICE parameters, some of the tested flip-flops did not work properly; it seems that the structure of the transistors and the internal nodes of those flip-flops using low supply voltage under nanotechnology are the main barrier to operate properly. A new low power, high speed DET-FF based on transmission gate is proposed as efficient DET-FF at the end of this paper, using 45 nm SPICE parameters, simulation results show that the proposed DET-FF has low power and high speed at low supply voltage.
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