Product failure root cause analysis during warranty analysis for integrated product design and quality improvement for early results in downturn economy
by Sudripto De, Arindam Das, Ashish Sureka
International Journal of Product Development (IJPD), Vol. 12, No. 3/4, 2010

Abstract: We present a Root Cause Analysis model for warranty failures that integrates the field failure data with the design improvement and internal quality-management data. Key features of the proposed model are: Ontology-Relationship-Diagram (ORD) to depict the Failure-Modes and Effect-Analysis (FMEA) data, conversion of ORD into a Bayesian Network (BN) in context to a Corrective Action Reports (CAR), usage of warranty claims data as the transactional data input to the BN to elicit probabilistic inference for warranty failure, application of text-processing technique for unstructured to structured data conversion. The benefits are reduction of Detection-To-Correction (DTC) cycle time and reduce liability exposure.

Online publication date: Tue, 02-Nov-2010

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