Crack detection in dielectric structures by a linear sampling approach
by G. Bozza, M. Brignone, M. Pastorino, M. Piana, A. Randazzo
International Journal of Signal and Imaging Systems Engineering (IJSISE), Vol. 3, No. 2, 2010

Abstract: In this paper, a new approach for the detection of cracks and defects inside dielectric structures is presented. The proposed algorithm is based on the Linear Sampling Method (LSM), which is a technique able to find the external shape of unknown objects starting from far-field measurements of the scattered electric field. In particular, in this contribution, the efficient No-Sampling LSM is modified to provide a reconstruction of the positions and shapes of defects located inside a known structure. This task is accomplished by inserting the Green's function of the unperturbed object into the far-field equation. The effectiveness of the approach is assessed by means of numerical simulations.

Online publication date: Tue, 31-Aug-2010

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