Simulation of effect of microwave irradiation on I-V characteristics of Josephson junction using RCLSJ model with noise into consideration
by M. Shahabuddin
International Journal of Nano and Biomaterials (IJNBM), Vol. 2, No. 1/2/3/4/5, 2009

Abstract: I-V characteristics of Josephson junction (JJ) under microwave irradiation is simulated taking the resistance, capacitance and inductance of the junction (RCLSJ) into account. Since most of the JJ made with high T_C material operates at high temperature where the thermal fluctuation is playing significant role. In the present simulation, thermal noise is also taken into consideration and simulated result explains the rounding behaviour of the Shapiro step observed in the experimental I-V curve. The simulated results also confirm the growing of Shapiro steps with increasing microwave power. This model also clearly account for the appearance of broad minima and reduction of the maxima in the power dependence of the step amplitude ΔI_n/2I_c as observed in the experimental data of Kautz et al. (1992).

Online publication date: Sat, 08-Aug-2009

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