Atomic force microscopy (AFM) analysis of cleaned and fouled nanofiltration membranes
by A. Al-amoudi, C. Wright, P. Williams, R.W. Lovitt, A. Al-Hobiab
International Journal of Nano and Biomaterials (IJNBM), Vol. 2, No. 1/2/3/4/5, 2009

Abstract: In membrane process industries, membrane cleaning is one of the most important concerns from both economical and scientific points of view. Surfaces roughness and phase angle of virgin and fouled membranes were measured and compared before and after chemical cleaning by using atomic force microscopy (AFM). Correlations between the data obtained by this technique (AFM) with the flux and rejection have also been discussed.

Online publication date: Sat, 08-Aug-2009

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