Simulation of near-tip crack behaviour and its correlation to fatigue crack growth with a modified strip-yield model
by Lei Wang, Yongkang Chen, William Tiu, Yigeng Xu
International Journal of Modelling, Identification and Control (IJMIC), Vol. 5, No. 1, 2008

Abstract: A modified strip-yield model has been developed to simulate the plasticity-induced crack closure under the constant amplitude (CA) and a single overload loading conditions. The paper focuses on the simulation of the near tip crack profiles and stress distributions during the fatigue process. Detailed information on near-tip stress and displacement fields at the maximum load (P_max), the minimum load (P_min), and the crack opening load (P_op) of a fatigue load cycle have been presented. The correlation of the crack closure to the near-tip material fatigue damage has been investigated and used to rationalise the crack growth behaviour under the CA and a single overload loading conditions.

Online publication date: Wed, 03-Dec-2008

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