Micro machining process of high temperature pressure sensor gauge chip based on SIMOX SOI wafer
by Quan Wang, Jianning Ding, Wei Xue, Zhiyong Ling
International Journal of Materials and Product Technology (IJMPT), Vol. 31, No. 2/3/4, 2008

Abstract: The successful batch fabrication of a piezoresistive pressure sensor chip is described based on separation by implantation of oxygen (SIMOX) SOI wafer. The micro machining process mainly includes SIMOX, homoepitaxy silicon, and heavy dose of boron ion implantation doping, thermal oxidation, passivation layer of silicon nitride and standard optical lithography, Inductively Coupled Plasma (ICP), multi-layer metallisation and Au sputtering and so on. The sensor packaged with this kind of sensing chip is presented with high accuracy and a good long-term stability in high temperature testing experiments up to 250°C.

Online publication date: Sun, 27-Apr-2008

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Materials and Product Technology (IJMPT):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com