Shortening carbon nanotube-tipped AFM probes
by Daniel J. Burns, Kamal Youcef-Toumi
International Journal of Nanomanufacturing (IJNM), Vol. 1, No. 6, 2007

Abstract: A method is presented to indirectly measure and shorten Carbon Nanotubes (CNTs) grown from the tips of Atomic Force Microscope (AFM) probes. The measurement component exploits the nanotubes ability to elastically buckle and requires only those signals and actuators available on a standard AFM. The shortening operation is facilitated by electric arcing using a conducting niobium substrate. The shortening operation produces stable CNTs at the tips of AFM probes which can then be functionalised for use as high-resolution, chemically specific force probes. An application to AFM-based DNA sequencing is also discussed.

Online publication date: Fri, 25-Apr-2008

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