Application of wavelet analysis to BIW assembly quality evaluation
by Zhu Ping, Wang Hua, Chen Guanlong
International Journal of Manufacturing Technology and Management (IJMTM), Vol. 14, No. 1/2, 2008

Abstract: The exact evaluation of Body-in-White (BIW) assembly quality is an important problem in the process control of BIW assembly quality. The Coordinate Measuring Machine (CMM) has been widely used in the BIW assembly industry. The process of BIW assembly is a non stationary time series. Leap, linear and periodical trends are three mean shifts of CMM data. This paper introduces one simple and applicable method to evaluate the BIW assembly quality with CMM data. Wavelet analysis is employed to separate the trend and variation in CMM data. The practical cases analysed by wavelet analysis prove the effectiveness of using variation to evaluate the BIW assembly quality. The data splitting error is estimated with Monte Carlo simulation.

Online publication date: Wed, 12-Mar-2008

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