Nano precision on-machine profiling of curved diamond cutting tools using a white-light interferometer
by Jiwang Yan, Hiroyasu Baba, Yasuhiro Kunieda, Nobuhito Yoshihara, Tsunemoto Kuriyagawa
International Journal of Surface Science and Engineering (IJSURFSE), Vol. 1, No. 4, 2007

Abstract: A non-contact on-machine measurement method is proposed for evaluating the profile accuracy of curved diamond cutting tools. The system is based on a compact white-light interferometer which is mounted on a three-axis numerical-controlled ultraprecision machine tool. An algorithm was developed to automatically identify the cutting edge location using the three-dimensional measurement data. Then the cross-sectional profile of the tool is extracted and the distribution of tool profile error is obtained. To measure tools with wide window angles and large curvatures, a data-stitching technique has been proposed for connecting the individually measured profiles from various orientations of the tool.

Online publication date: Tue, 15-Jan-2008

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