FEM analysis of crystallisation residual stresses in composite Ni-P(B4C) films
by M. Boniardi, G.C. Martinelli, B. Bozzini, R. Vitali
International Journal of Materials and Product Technology (IJMPT), Vol. 15, No. 1/2, 2000

Abstract: The thermo-mechanical behaviour of supported MMC Ni-P(B4C) coatings was studied with a FEM modelling and experimental methods. Crystallisation residual stresses in the Ni-P matrix were computed by means of a sub-model technique and were measured with two independent methods X-ray diffractometry and Vickers indentation. The main conclusions of the FEM simulation are: (i) the matrix is in a tensile stress status and the dispersoid in a compressive one; (ii) the matrix is plasticised; (iii) no appreciable stress gradients as a function of coatings depth are pre- sent, except for slight (~5%) variations at the coating surface and at the coating-substrate interface. Experimental residual stresses are consistent and in quantitative agreement with maximum tensile stress values from FEM simulations. The stress distribution predicted by FEM was verified with crack path observations by SEM.

Online publication date: Tue, 01-Jul-2003

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Materials and Product Technology (IJMPT):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com