An efficient approach for defect detection in pattern texture analysis using an improved support vector machine Online publication date: Mon, 07-Jun-2021
by I. Manimozhi; S. Janakiraman
International Journal of Business Intelligence and Data Mining (IJBIDM), Vol. 18, No. 4, 2021
Abstract: Texture defect detection can be defined as the process of determining the location and size of the collection pixels in a textured image which deviate in their intensity values or spatial in compression to a background texture. The detection of abnormalities is a very challenging problem in computer vision. In our proposed method we have designed a method for detecting the defect of pattern texture analysis. Initially, features are extracted from the input image using the grey level co-occurrence matrix (GLCM) and grey level run-length matrix (GLRLM). Then the extracted features are fed to the input of classification stage. Here the classification is done by improved support vector machine (ISVM). The proposed pattern analysis showed that the traditional support vector machine is improved by means of kernel methods. In the final stage, the classified features are segmented using the modified fuzzy c means algorithm (MFCM).
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