Machine learning algorithms benchmarking for real-time fault predictable scheduling on a shop floor
by Wenda Wu; Wei Ji; Lihui Wang; Liang Gao
International Journal of Manufacturing Research (IJMR), Vol. 16, No. 1, 2021

Abstract: To select a proper machine learning algorithm for fault predictable scheduling on a shop floor, ten algorithms in the machine learning field have been selected, implemented and compared in this research. Due to the lack of applicable real data to the authors, a data generation method is proposed in terms of data complexity, number of data attributes and data depth. On top of the method, six datasets are generated by selecting three-level data attributes and three-level data depths, which were used to train the ten algorithms. The performances of the algorithms are evaluated by considering three indexes including, training accuracy, testing time and training time. The results demonstrate that naive Bayes classifier is suitable to low-complexity data and that convolutional neural network and deep belief network fit well in high-complexity data, such as the real data. [Submitted 25 June 2018; Accepted 27 May 2019]

Online publication date: Tue, 06-Apr-2021

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Manufacturing Research (IJMR):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com