On a stochastic degradation model based on the generalised inverse Gaussian distribution
by Leona Tamaru; Hideki Nagatsuka
Asian J. of Management Science and Applications (AJMSA), Vol. 4, No. 1, 2019

Abstract: A stochastic degradation model based on the generalised inverse Gaussian (GIG) distribution is provided. The proposed model can be seen a generalisation of the prominent existing degradation models in a sense, under the mild conditions, and it might be more flexible than the existing ones. The maximum likelihood estimation of the proposed model is also developed. Two case applications are performed to demonstrate the advantages of the proposed model, based on the well-known real degradation data sets of the GaAs laser devices and crack sizes of specimens.

Online publication date: Wed, 07-Aug-2019

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