Full Citation and Abstract
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Title: |
Novel Imaging Technologies: From Cancer Detection To Defense, Semiconductor Inspection And Nanophotonics |
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Author(s): |
George C. Giakos |
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Address: |
Imaging Technologies, Photonics, Applied Nanoscience Laboratories
Department of Electrical and Computer Engineering
The University of Akron, Akron, OH 44325
Department of Electrical and Computer Engineering
The University of Akron, Akron, OH 44325
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Reference: |
SSIP-SP1, 2005 pp. 15 - 28 |
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Abstract/
Summary |
In this paper, two novel paradigms of imaging technologies based on multifusion detection principles are presented and discussed. The first of the two paradigms introduces the principles of multimedia, multidensity, multiatomic-number detection principles and it relies on the fusion of multiple detector media of different atomic number, composition and density. As a result, it allows the acquisition of highcontrast 'interference-free' x-ray energy subtraction images, at more than one energies, as well as it offers a high degree of freedom in the calibration and optimization of the imaging system. The second imaging paradigm operates on multispectral Stokes parameters image differences, Degree of Linear Polarization (DOLP) image differences, and Mueller Matrix image differences. As a result, highcontrast, high-specificity images can be obtained, by removing the background from the target. The presented imaging technologies contain high imaging potential and can be successfully applied to a variety of applications such as cancer detection and molecular imaging, nanophotonics, homeland security and national defense, detection of improvised explosive devices, semiconductor wafer inspection, and industry. |
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