Article Abstract

	Title:	Distributed sensor system for fault detection and isolation in multistage manufacturing systems
	Author:	Du Shi-Chang, Xi Li-Feng, Shi Jian-Jun
	Address:	Department of Industrial Engineering and Management, School of Mechanical Engineering, Shanghai Jiaotong University, Shanghai, PR China. ' Department of Industrial Engineering and Management, School of Mechanical Engineering, Shanghai Jiaotong University, Shanghai, PR China. ' Department of Industrial and Operations Engineering, The University of Michigan, Ann Arbor, MI 48109, USA
	Journal:	International Journal of Computer Applications in Technology 2006 - Vol. 25, No.4  pp. 182 - 191
	Abstract:	With rapid innovations in sensing technology and the rising complexity in manufacturing processes, increasingly less expensive and smart devices with multiple heterogeneous on-board sensors, networked through wired or wireless links and deployable in large numbers, are distributed throughout complex Multistage Manufacturing Systems (MMSs). The Distributed Sensor System (DSS) provides unprecedented opportunities for fault detection and isolation. The related issues of the state-of-the-art practice, research challenges and future directions related to software infrastructure of a distributed sensor network are discussed, which include optimal design of DSSs, design criteria, data management, information processing and decision-making. Applications based on the authors' research experiences are also given.
	Keywords:	distributed sensor systems; DSS; fault detection; fault isolation; multistage manufacturing systems; MMS; sensor networks; distributed control; optimal design; data management; information processing; decision making; industrial automation.
	DOI:	10.1504/IJCAT.2006.009391
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Article's references with DOI links:

• Akyildiz, Computer Networks. 2002 - Vol. 38, No. 4 p. 393
  
• Apley, Technometrics. 2001 - Vol. 43, No. 1 p. 84
  
• Ding, Journal of Manufacturing Science and Engineering. 2002 - Vol. 124, No. 2 p. 313
  
• Ding, Journal of Dynamic Systems Measurement and Control. 2002 - Vol. 124, No. 1 p. 1
  
• Dorr, IEEE Transactions on Control Systems Technology. 1997 - Vol. 5, No. 1 p. 42
  
• Jin, Technometrics. 1999 - Vol. 41, No. 4 p. 327
  
• Khan, Journal of Manufacturing Science and Engineering. 2000 - Vol. 122, No. 1 p. 215
  
• Kibarian, IEEE Transactions on Semiconductor Manufacturing. 1991 - Vol. 4, No. 3 p. 219
  
• Luo, IEEE Sensors Journal. 2002 - Vol. 2, No. 2 p. 107
  
• Meinhold, The American Statistician. 1983 - Vol. 37, No. 2 p. 123
  
• M?ller-Fiedler, Microelectronics Reliability. 2003 - Vol. 43, No. 7 p. 1085
  
• Nagel, Microelectronics Journal. 2002 - Vol. 33, No. 1-2 p. 107
  
• Viswanathan, Proceedings of the IEEE. 1997 - Vol. 85, No. 1 p. 54
  
• Zhou, Technometrics. 2003 - Vol. 45, No. 4 p. 312