Article Abstract

	Title:	Modelling Microstructures with OOF2
	Author:	Andrew C.E. Reid, Rhonald C. Lua, R. Edwin Garcia, Valerie R. Coffman, Stephen A. Langer
	Address:	Information Technology Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8910, Gaithersburg, MD, 20899-8910, USA. ' Materials Science and Engineering Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8555, Gaithersburg, MD, 20899-8555, USA. ' School of Materials Engineering, Purdue University, West Lafayette, IN, 47907-2044, USA. ' Materials Science and Engineering Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8555, Gaithersburg, MD, 20899-8555, USA. ' Information Technology Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8910, Gaithersburg, MD, 20899-8910, USA
	Journal:	International Journal of Materials and Product Technology 2009 - Vol. 35, No.3/4  pp. 361 - 373
	Abstract:	OOF2 is a program designed to compute the properties and local behaviour of material microstructures, starting from a two-dimensional representation, an image, of arbitrary geometrical complexity. OOF2 uses the finite element method to resolve the local behaviour of a material, and is designed to be used by materials scientists with little or no computational background. It can solve for a wide range of physical phenomena and can be easily extended. This paper is an introduction to some of its most basic and important features.
	Keywords:	finite element method; FEM; material microstructure.
	DOI:	10.1504/IJMPT.2009.025687
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