Article Abstract
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Title: |
Application of new Apriori algorithm MDNC to TFT-LCD array manufacturing yield improvement |
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Author: |
Chiung-Fen Huang, Ruey-Shun Chen 
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Address: |
Institute of Information Management, Chiao Tung University, Hsinchu, Taiwan 300, ROC. ' Institute of Information Management, Chiao Tung University, Hsinchu, Taiwan 300, ROC |
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Journal: |
International Journal of Computer Applications in Technology 2007 - Vol. 28, No.2/3 pp. 161 - 168 |
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Abstract: |
With the trend and demand of larger panels and higher resolution in Thin Film Transistor-Liquid Crystal Display (TFT-LCD) panels, yield improvement has become the key factor in TFT-LCD manufacturing. This paper presents a successful and effective data mining methodology for TFT-LCD manufacturing yield improvement. We have modified an Apriori algorithm called Multi-Dimension Non-Continuous (MDNC) by eliminating the limitations imposed by traditional pattern matching of continuous data, to mine the association rules in the cross-day discrete manufacturing data and find out some valuable information. The results show how to effectively locate any machine with low yield and vastly improve it in TFT-LCD large panel manufacturing yield-rate, thereby reducing the manufacturing cycle time, the frequency of holding lot by adaptation of MDNC. |
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Keywords: |
Apriori algorithm; association rules; data mining; thin film transistor-liquid crystal display; TFT-LCD manufacturing; yield improvement; cycle time reduction. |
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DOI: |
10.1504/IJCAT.2007.013353 |
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