Chi-squared control chart for multiple attributes
by Salah Haridy; Zhang Wu; John Flaig
International Journal of Industrial and Systems Engineering (IJISE), Vol. 12, No. 3, 2012

Abstract: In recent years, attribute control charts have been increasingly adopted in manufacturing processes and service sectors for monitoring the quality characteristics that cannot be numerically measured. The multiattribute control charts have been proved to be more effective than the simultaneous multiple individual charts for monitoring multiattribute processes. In this paper, a new multiattribute chi-squared (Χ²) chart is proposed to monitor the processes in which more than one type of defects exist on the non-conforming item. Some practical examples are given to illustrate the effectiveness of the new chart in monitoring the multiattribute processes compared with that of the individual p charts and other multiattribute charts.

Online publication date: Wed, 03-Oct-2012

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Industrial and Systems Engineering (IJISE):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com