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Research of probability characteristics in defect detection of composite materials using wavelet transform
by V. Gerasimov, V. Khandetsky, S. Gnoevoy
International Journal of Materials and Product Technology (IJMPT), Vol. 27, No. 3/4, 2006

 

Abstract: Parameters of identification of surface crack signals Kh and Kw are proposed based on features of the Fourier spectrum and the wavelet spectrogram of modulation impulses defined using an eddy current sensor. Probability performances of defect detection using both spectral and wavelet methods are defined depending on the probability of a false alarm. Simulation data revealed that both methods have a good ability to identify short and shallow surface cracks. The wavelet method has the best probability of defect detection compared with the spectral method in case intensive noise. The spectral method is faster and preferable at small noise levels.

Online publication date: Fri, 10-Nov-2006

 

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