The full text of this article:

Application of projection image of end mill to monitor its behaviour
by Zuo Dunwen, Kawano Yoshihiro
International Journal of Computer Applications in Technology (IJCAT), Vol. 28, No. 1, 2007
Abstract: End mills with smaller diameter have found their wide application with the development of high-speed cutting. It becomes more and more important to develop effective methods to monitor and control the milling process with small end mills. In this paper, a measuring system of projection image for small end mills is introduced, and the application of the projection image to monitor the behaviour of the end mill is discussed. It is found that for static state of φ2 mm end mill, the measurement accuracy of its image width can be easily controlled within 1 μm. When the end mill rotates, it is not so difficult to control the accuracy within 3 μm. By using the change in the image width, the radial wear of the end mill can be estimated. On the other hand, if the centre shift of the image is premeasured the deflection of the end mill during cutting can be estimated.

is only available to individual subscribers or to users at subscribing institutions.

Pay per view: If you are not a Subscriber and you just want to read the full contents of this article, please click here to purchase online access to the full-text of this article. Please allow 3 days + mailing time. Current price for article is Thirty Euros (€30)

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Computer Applications in Technology (IJCAT) journal, that have been redirected here, please check if you have a registered username/password subscription with Inderscience. If that is the case, please Login:

If you are not yet a Subscriber to International Journal of Computer Applications in Technology (IJCAT) journal, you can subscribe by following a few simple and quick steps. A subscription will give you complete access to all articles in the current issue, as well as to all articles in the previous three years, where applicable. Click here to subscribe.

Should you experience further difficulties or have any enquiries, please email subs@inderscience.com