International Journal of Reliability and Safety

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Editor in Chief: Prof. Zissimos P. Mourelatos
ISSN online: 1479-3903
ISSN print: 1479-389X
4 issues per year
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IJRS provides an authoritative source of information and an international forum in the field of reliability and safety. It is a highly professional and refereed journal that aims to achieve a balance between academic rigour and practical applications from all disciplines. In addition, prominent members of the reliability and safety community may serve as guest editors of special issues dedicated to a specific subject.

 



 Topics covered include

  • Reliability assessment methods
  • Uncertainty quantification and propagation using probabilistic and non-probabilistic methods
  • Engineering decisions under uncertainty
  • Probabilistic and non-probabilistic safety assessment
  • Reliability and safety relationship
  • Engineering design for safety and reliability
  • Reliability-based condition assessment
  • Reliability-based design optimisation
  • Robust design
  • Progressive reliability
  • System reliability
  • Random fields
  • Stochastic finite elements
  • Other relevant topics

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Objectives

The goal of IJRS is to provide an international forum for information exchange in the development and application of non-deterministic methods and practices for the enhancement of product and process reliability and safety. It also aims to help engineers, applied scientists, educators and policy makers to contribute, disseminate information and learn from each other|s work in the area of reliability and safety.


Readership

Professionals, academics, researchers and managers of all disciplines in the area of reliability and safety.


Contents

IJRS publishes original and review papers, technical reports, case studies, conference reports, management reports, book reviews, notes, commentaries and news. Contribution may be by submission or invitation. Suggestions for special issues and publications are welcome.


 

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 IJRS is indexed in:

 

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Editor in Chief

  • Mourelatos, Zissimos P., Oakland University, USA
    (mourelat@oakland.edu)

    Associate Editors

    • Beer, Michael, University of Liverpool, UK
    • Katafygiotis, Lambros, Hong Kong University of Science and Technology, Hong Kong
    • Mahadevan, Sankaran, Vanderbilt University, USA
    • Nikolaidis, Efstratios, The University of Toledo, USA
    • Papadimitriou, Costas, University of Thessaly, Greece
    • Yadav, Om Prakash, North Dakota State University, USA

    Editorial Board Members

    • Au, Siu-Kui, City University of Hong Kong, Hong Kong
    • Azarm, Shapour, University of Maryland, USA
    • Beck, James L., California Institute of Technology, USA
    • Bucher, Christian, Vienna University of Technology, Austria
    • Cafeo, John, GM R&D Center, USA
    • Ching, Jianye, National Taiwan University of Science and Technology, Taiwan
    • Chiodo, Elio, Universitą degli Studi di Napoli Federico II, Italy
    • Choi, Kyung K., University of Iowa, USA
    • Conte, Joel P., University of California, San Diego, USA
    • Du, Xiaoping, University of Missouri - Rolla, USA
    • Elishakoff, Isaac, Florida Atlantic University, USA
    • Faber, Michael, Technical University of Denmark, Denmark
    • Faravelli, Lucia, University of Pavia, Italy
    • Gea, Hae Chang, Rutgers, The State University of New Jersey, USA
    • Ghiocel, Dan M., Ghiocel Predictive Technologies, Inc, USA
    • Gorsich, David J., US Army TARDEC, USA
    • Grandhi, Ramana, Wright State University, USA
    • Grigoriu, Mircea, Cornell University, USA
    • Haftka, Raphael (Rafi), University of Florida, USA
    • Haukaas, Terje, University of British Columbia, Canada
    • Jensen, Hector, Santa Maria University, Chile
    • Kececioglu, Dimitri B., University of Arizona, USA
    • Kim, Jongbae, Sungshin University, Republic of Korea
    • Kim, Nam-Ho, University of Florida, USA
    • Kokkolaras, Michael, University of Michigan, USA
    • Krishnamurty, Sundar, University of Massachusetts, USA
    • Lee, Yung-Li, DaimlerChrysler Corp, USA
    • Ling, Jing, DaimlerChrysler, USA
    • Modarres, Mohammad, University of Maryland, USA
    • Muhanna, Rafi L., Georgia Institute of Technology, USA
    • Nair, Prasanth B., University of Southampton, UK
    • Papadrakakis, Manolis, National Technical University of Athens, Greece
    • Papalambros, Panos Y., University of Michigan, USA
    • Pettit, Chris L., United States Naval Academy, USA
    • Phoon, Kok Kwang, National University of Singapore, Singapore
    • Pierre, Christophe, McGill University, Canada
    • Quek, Ser Tong, National University of Singapore, Singapore
    • Singhal, Suren, NASA Marshall Space Flight Center, USA
    • Sobczyk, Kazimierz, Polish Academy of Science, Poland
    • Tang, Wilson, Hong Kong University of Science and Technology, Hong Kong
    • Thacker, Ben H., Southwest Research Institute, USA
    • Tonon, Fulvio, The University of Texas at Austin, USA
    • Vaccaro, Alfredo, University of Sannio, Italy
    • Wu, Justin Y-T., Applied Research Associates, Inc, USA
    • Xie, Liyang, Northeastern University, China
    • Yang, Ren-Jye, Ford Research and Advanced Engineering, USA
    • Yuen, Kelvin Ka-Veng, University of Macau, China

     

    A few essentials for publishing in this journal

     

    • Submitted articles should not have been previously published or be currently under consideration for publication elsewhere.
    • Conference papers may only be submitted if the paper has been completely re-written (taken to mean more than 50%) and the author has cleared any necessary permissions with the copyright owner if it has been previously copyrighted.
    • All our articles are refereed through a double-blind process.
    • All authors must declare they have read and agreed to the content of the submitted article. A full statement of our Ethical Guidelines for Authors (PDF) is available.

     

    Submission process

     

    All articles for this journal must be submitted using our online submissions system.

    Read our Submitting articles page.